The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing an X-Ray Diffractometer (XRD). The CNST NanoFab is a state-of-the-art nanofabrication laboratory, and the XRD will be used to characterize samples ranging from a few mm in size to 6" round wafers. The vast majority of the samples will consist of multi-layer thin films requiring the measurement of the following properties: phase identification, grain size, interfacial layers, atomic concentration, thickness, density, roughness, and stress. Wafer mapping will be required. Other samples will contain nanoparticles or nanopores and the XRD will measure nanoparticle size, distribution and shape.

The XRD shall also be capable of analyzing single crystal samples and powders. The instrument shall be equipped with the hardware and software necessary to utilize a variety of techniques: glancing angle diffraction, X-ray reflectometry, in-plane diffraction, rocking curves, pole figures, reciprocal space maps and small angle X-ray scattering. All slits shall be adjustable, motorized and computer-controlled, with no manual re-alignment needed when switching any optical element. The system will be sited in a multi-user facility where ease of use, intuitive software, fast and easy conversion from one technique/configuration to another, and ruggedness are of paramount importance.

After results of this market research are obtained and analyzed and specifications are developed for an X-Ray Diffractometer (XRD) that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside.

NIST has a need for an XRD that would meet the following requirements:

X-Ray Source

NIST will consider the following sources with, typically, copper Kα (K-alpha) radiation:
• Standard sealed tube (2-3 kW)
• Rotating anode (6-9 kW)

Goniometer

A five-axis theta-theta vertical goniometer is preferred in order for the sample to be nearly horizontal at all times.

Sample stages

The sample stages must provide for XYZ movement of the sample (minimum XY -50 to +50 mm) and tilts required for in-plane measurements.

High temperature stage

Room to 1100°C with vacuum, air and inert gas capabilities

Incident Beam Optics
A method of switching optical configuration quickly and without realignment or with automated re-alignment is necessary.

Diffracted beam Optics

All diffracted beam optics must have the ability to be switched quickly, easily, and without any realignment or automated re-alignment. The goniometer must be capable of automatically aligning the optics and full optical path.

Small Angle X-Ray Scattering (SAXS)

The theta-theta XRD system must be able to be switched to SAXS optics rapidly without any realignment and, if possible, without handling the x-ray mirror

Detectors

Three detectors will be considered
• Scintillation counter (point detector) for high resolution
• Linear position sensitive detector for Bragg-Brentano methods and fast reciprocal space mapping
• Area detector for extra-fast mapping, texture and stress measurements

Cabinet and chiller

A radiation enclosure with easy and open access will be provided. It will be of steel construction with lead panels, lighted interior and viewing windows. It will meet all federal and Maryland State regulations. If needed, a water-cooled chiller will be supplied.

Accessories

Sample holders and spacers, wafer holders, reference standards, fluorescent screen, radiation meter

Software

Software packages will be supplied for instrument control, automatic alignment, data collection and analysis.

NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company's size classification in any response to this notice.

Companies that manufacture such X-Ray Diffractometers (XRD) are requested to email a detailed report describing their capabilities to [email protected] no later than the response date for this sources sought notice. The following information is requested to be provided as part of the response to this sources sought notice:

1. Name of the company that manufactures the system components for which specifications are provided.

2. Name of company(ies) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address).

3. Indication of number of days, after receipt of order that is typical for delivery of such systems.

4. Indication of whether each instrument for which specifications are sent to [email protected] are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s).

5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research.

Point of Contact
Paula Wilkison, Contract Specialist, Phone (301) 975-8448, Email [email protected]

Bid Protests Not Available