Amendment #A001 to solicitation SB1341-10-RQ-0550 Stylus Profilometer.

The above referenced solicitation is hereby amended to respond to technical questions submitted, incorporate technical changes, and extend the due date for quotations.

1) Technical questions and responses are hereby provided:

QUESTION #1: What are the ranges of the thickness of the films (step heights) that will need to be measured?

RESPONSE #1: The film thickness is expected to range from 20 nm to 5 m; however, a maximum z-range of 1.2 mm is specified for possible unforeseen microfluidic applications.

QUESTION #2: Is surface roughness something that will need to be measured with the profilometer? If so, what range of roughness average (Ra) will need to be measured?

RESPONSE #2: Yes, the surface roughness is expected to range from < 1 nm to 0.5 µm.

QUESTION #3: What are the ranges of the size of the samples that need to be measured? Will you need to measure round silicon wafers (if so, what diameter wafers?) Will you need to measure microscope slides or pieces of wafers?

RESPONSE #3: We expect to measure chips up to 1 cm by 1 cm, wafers up to at least 6 inches in diameter, and microscope slides.

QUESTION #4: Are 3D scanning and 3D surface analysis capabilities important to your application for report generation?

RESPONSE #4: No, it is not required for this solicitation; however preference will be given for a system that provides the possibility of upgrading to 3D analysis in the future.

2) The following changes are hereby incorporated to the specifications under Line Item 0001.

2.1) Specification #11 is added:

11. Measurement of the standard deviation with an expected range from < 1 nm to < 5 µm

3) The due date for quotations is hereby extended:

From: 3:00 PM eastern time, on July 26, 2010.
To: 3:00 PM eastern time, on July 28, 2010.

Bid Protests Not Available