SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309SPECTROSCOPIC ELLIPSOMETER
FA8601-14-R-0016
This is a Sources Sought Synopsis; there is no solicitation available. Requests for a solicitation will not receive a response. This Sources Sought Synopsis is published for market research purposes. This market research will be used to help determine if this may be a competitive acquisition, or if a set-aside for any small business program is appropriate (Small Business, 8(a), HUBZone, Service-Disabled Veteran Owned (SDVO), Women Owned (WO) small businesses). Please review this announcement, including all attachments, in their entirety. Request that prospective offerors complete and return a Capabilities Statement that describes the comparable product and its specifications as described below in Attachment 1 to identify firms who possess the capability to provide a Spectroscopic Ellipsometer and accessories capable of extracting thickness and index of refraction for single or multi-layer transparent and semi-transparent thin films or coatings. It is equipped with fully automated alignment of stage tip/tilt focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683nm simultaneously. Typical acquisition time is 5 sec per angle. Elliptically polarized light reflects from the measurement sample and the change in polarization is measured as Delta and Psi. Delta is the phase shift between the two vector components of the elliptically polarized light. Tan (Psi) is the amplitude ratio of the two components. A model is fit to this data to extract film parameters. Air Force Institute of Technology (AFIT) fabricates devices and uses the instrument to characterize the various types of thin-film materials AFIT fabricates. Delivery date: 120 days After Receipt of Order (ARO). The Government is in no way obligated to do business with or to enter into any form of contract with any person, firm or other entity that receives or responds to this announcement.
The Operational Contracting Branch, Base Support Acquisition Section (AFLCMC/PZIOBB) is seeking potential sources, including small business sources.
In addition to the information requested in the paragraph below, entitled "Specifications," responding parties must also indicate their size status in relation to the applicable North American Industry Classification System (NAICS). The NAICS Code is 334516 with a Size Standard of 500 employees. Also, indicate if you are a manufacturer or provide the name and size of the manufacturer of this product or the product(s) you will be supplying. Respondents are further requested to indicate their status as a foreign-owned/foreign-controlled firm and any contemplated use of foreign national employees on this effort.
SPECIFICATIONS: Interested parties must submit a Specifications sheet for the proposed product. The specifications sheet should contain any information that the interested party feels is relevant.
POINT OF CONTACT: Gwendolyn Brown, [email protected], (937) 522-4566, fax (937) 904-3637. Submit Capabilities Statements (e-mail preferred) by 12:00 p.m. Eastern Time on 22 November 2013. Send Capabilities Statements or other correspondence to:
AFLCMC/PZIOBB
ATTN: Gwendolyn Brown 1940 Allbrook Drive, Room 109 Wright-Patterson AFB OH 45433-5309

Bid Protests Not Available