An AFM is a surface characterization tool that uses a nanometer scale probe tip to scan the surface of a material to measure surface topology at the nanoscale. AFMs are also used to measure bulk properties such as hardness, conductivity, magnetic, and thermal-mechanical. The AFM is a very high-resolution microscopy tool, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. In addition, the AFM is a nondestructive measurement technique that can provide direct critical measurement data on nanoscale devices during the fabrication process. The AFM is an essential tool to NanoFab users and there is an increasing demand for more AFM capacity, improved measurement resolution and improved ability to adapt the AFM hardware and programming to the needs of researchers. NIST has a need for a high resolution AFM with improved capability, adaptability, and programming flexibility.

After results of this market research are obtained and analyzed and specifications are developed for the high resolution AFM, NIST may conduct a competitive procurement and subsequently award a purchase order.