1.0 General
The following specification describes the purchase requirements for an integrated Electron Backscattered Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) system. The system shall include all components for operation including the EBSD and EDS detectors, stage and electron beam control software, acquisition and analysis software, computer and monitor for use within an existing Scanning Electron Microscope (SEM). The existing SEM is an FEI Helios Plasma Focused Ion Beam (PFIB). All components are to be new (no demonstration or used equipment will be acceptable). All responses shall be specific and detailed enough to allow full evaluation of the equipment and its capabilities, namely specifications of the EBSD and EDS systems. All components shall be covered by a comprehensive, one-year (minimum) warranty and shall include installation, including any support required from the PFIB manufacturer, and on-site instruction of the use of the system.

2.0 Requirements
• >1300 patterns per second indexing
• SDD EDS detector
• Simultaneous EBSD/EDS
• All necessary plug-ins to support 3D EBSD and EDS
• Fully adjustable gain controls
• User adjustable exposure time
• EBSD pattern indexing to improve accuracy
• Greater than 10 positional electron detectors to create electron images detailing differences in orientation, atomic number, and sample topography with live viewing
• Motorized slides for EBSD and EDS detectors

3.0 Trade-in
The use of existing U.S Government property to be used as a trade-in option for replacement of identical or superior equipment. The existing equipment is an Oxford X-Max 50mm2 EDS system, model 51- XMX0009 and serial number 35430. The trade in option involving the 50mm2 EDS will not occur if a replacement (upgrade) is not immediately available.