The purpose of this amendment is to address the following vendor questions and answers:

Question : NIST requires the capability to scan the stage and the tip. The tip should be placed within an area of 10 um x 10 um without having to move the stage.  To clarify: This AFM will scan the Tip in AFM imaging modes up to 10um X 10um and the Stage in AFM imaging modes 100um X 100um?

Answer: Yes, that is correct

Question: NIST requires co-located AFM/Raman. Does the co-located AFM/Raman have to be simultaneously collected or is a sequential AFM then Raman measurement sufficient?

Answer: Simultaneous Raman/AFM acquisition