Federal Bid

Last Updated on 30 Sep 2010 at 10 AM
Combined Synopsis/Solicitation
Bureau Illinois

Atomic Force-Scanning Electrochemical Microscope-Raman Spectroscopy System

Solicitation ID SB1341-10-RQ-0462
Posted Date 16 Jul 2010 at 7 PM
Archive Date 30 Sep 2010 at 5 AM
NAICS Category
Product Service Code
Set Aside No Set-Aside Used
Contracting Office Department Of Commerce Nist
Agency Department Of Commerce
Location Bureau Illinois United states

The purpose of this amendment is to address the following vendor questions and answers:

Question : NIST requires the capability to scan the stage and the tip. The tip should be placed within an area of 10 um x 10 um without having to move the stage.  To clarify: This AFM will scan the Tip in AFM imaging modes up to 10um X 10um and the Stage in AFM imaging modes 100um X 100um?

Answer: Yes, that is correct

Question: NIST requires co-located AFM/Raman. Does the co-located AFM/Raman have to be simultaneously collected or is a sequential AFM then Raman measurement sufficient?

Answer: Simultaneous Raman/AFM acquisition

 

 

 

Bid Protests Not Available

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