SOURCES SOUGHT NOTICE
(Acquisition of a JPK NanoWizard® 4 XP Nano Science Atomic Force Microscope (AFM) System)
AGENCY:  The National Institutes of Health, National Institutes of Diabetes and Digestive and Kidney Diseases (NIDDK)

TITLE: Acquisition of a JPK NanoWizard® 4 XP Nano Science Atomic Force Microscope (AFM) System
PROPOSED SOLICITATION NUMBER: NICHD-21-138
PROJECT SERVICE CODE: 6640 - LABORATORY EQUIPMENT
AND SUPPLIES

This is a Small Business Sources Sought notice. This is NOT a solicitation for proposals, proposal abstracts, or quotations. There is no solicitation available at this time.

The purpose of this notice is to obtain information regarding: (1) the availability and capability of all qualified small business sources; (2) whether they are small businesses; HUBZone small businesses; service-disabled, veteran owned small businesses; 8(a) small businesses; veteran-owned small businesses; woman-owned small businesses; or small disadvantaged businesses; and (3) their size classification according to the North American Industry Classification System, (NAICS) code for the proposed acquisition. Your responses to the information requested will assist the Government in determining the appropriate acquisition method, including whether a set- aside is possible. An organization that is not considered a small business under the applicable NAICS code should not submit a response to this notice.

BACKGROUND:
The mission of the National Institutes of Health (NIH) is to seek fundamental knowledge about the nature and behavior of living systems and to apply that knowledge to enhance health, lengthen life, and reduce illness and disability.  

As part of the NIH, the National Institute of Diabetes and Digestive and Kidney Diseases (NIDDK) Intramural Research Program (IRP) conducts biomedical research and training related to diabetes mellitus; endocrine, bone, and metabolic diseases; digestive diseases, including liver diseases and nutritional disorders; and kidney, urologic, and hematologic diseases. Intramural research is conducted in the Institute's laboratories and clinical facilities in Bethesda, Maryland and in Phoenix, Arizona.  

Miroshnikova lab and the Section on Nuclear Mechanotransduction and Cell Fate Dynamics is part of Laboratory of Molecular Biology (LMB), which is one of NIDDK IRP 17 Laboratories and Branches.  Miroshnikova lab’s work requires, on an ongoing basis, advanced mechanical characterization methods to qualitatively complement other assays, as well as quantitate the major experimental conditions of the section in living cells and organisms. JPK’s atomic force microscope is leading, high-resolution system combing atomic resolution and fast scanning with rates of up to 150 lines/sec and a large scan range of 100µm in one system allowing cell-cell force quantification in addition to mechanical properties of cells, organelles and tissues. It is designed to provide highest mechanical and thermal stability on inverted optical microscopes during long term experiments on samples ranging from single molecules to living cells and tissues. Thus, it is ideal for live cell and tissue/organism imaging and quantitation, which is at the core of Miroshnikova lab operations.

The objective of this requirement is to purchase a new live-sample microscope system with DirectOverlay™ 2 software compatibility for perfect integration and data correlation with advanced fluorescence microscopy platforms; meaning that the system must allow calibration of optical images and precisely overlay both the optical and the AFM images. This system must conduct mechanical characterization and cell-cell adhesion measurements due to 100micron z scan size, as well as side visualization of the sample.

SALIENT / REQUIRED FEATURES AND SPECIFICATIONS:

The new equipment must include the below features necessary to satisfy day to day Miroshnikova lab operations.

Atomic Force Microscope (AFM) System
AFM Head 
•    Multi-purpose stand-alone tip-scanning design 
•    Closed-loop atomic lattice resolution (mica in buffered solution) on inverted microscope under suitable environmental conditions 
•    Drift minimized concentric design 
•    Available sample size Ø140mm x18mm; unlimited for large samples due to tip-scanning design 
•    Head completely sealed against vapor and liquids 
•    High Resolution Mode (HRM) delivers atomic resolution (mica lattice in air or buffered solution) on inverted microscope under suitable environmental conditions (active vibration isolation and acoustic enclosure) 
•    Lowest cantilever deflection noise of any commercial AFM (<2pm RMS) 
•    Bandwidth of deflection-detection: 8 MHz 
•    Thermal noise cantilever calibration up to 3.25 MHz 
•    Supported imaging modes in air and liquid: 
o    PeakForce Tapping™ for easy and straight forward imaging (SW-06-10) 
o    Contact mode with lateral force (LFM), 
o    TappingMode™ with Phase Imaging, QI™ mode, AC modes with optional Q-control, higher harmonics, FM or PM-AFM, MFM, 
o    Electrical modes, magnetic modes, mechanical modes with optional accessories 
•    Supported non-imaging modes: 
o    Force-distance spectroscopy, other point spectroscopy 
o    Fast force mapping, 
o    Optional advanced modes and lithography/manipulation 
•    Scanner specifications: 
o    Advanced closed loop control for lowest settling time and prevention of overshoot and ringing 
o    Z axis mechanically decoupled from XY scanner 
o    3 axis capacitive position sensors for closed-loop operation 
o    Z-noise (in feedback): <30pm RMS 
o    XY scan range: 100μm x 100μm (<90pm RMS sensor noise level) 
o    Z scan range: 15μm (<40pm RMS sensor noise level) 
•    IR low-coherence light source with vertical incidence 
•    Designed for integration with inverted optical microscopes supporting fluorescence, confocal laser scanning microscopy, TIRF, Raman, and many more 
•    Optical filters for elimination of cross talk with fluorescence illumination 
•    High transmission optical access from top and bottom for condenser illumination and optical viewing 
•    In-situ switch from air to liquid operation 
•    Physical access to cantilever region from all sides (e.g. micro pipettes) 
•    Three precision motors for automatic approach and tilt-correction 
•    Stand for AFM head included 
•    Includes SP-90-08 JPK Cantilever holder with fixed spring 
•    Cantilever holder is easy to clean with detergents, certain solvents and ultrasonic bath 
•    Stand for AFM head included 

JPK Head  
•    Contains exchangeable single cell force sensor holder and force measurement system in a rugged, compact chassis 
•    Precise force measurements on single cells with single molecule resolution 
•    Determination of interaction strength, mechanical response, elasticity, and distances on the nanoscale 
•    100μm vertical sensor movement range for complete cell-substrate separation 
•    Three stepper motors for automated sensor approach 
•    Compatible with top-view optical systems such as JPK TopViewOptics™ or Macroscopes from Zeiss, Olympus or Leica 
•    Vertical optical access for phase contrast and DIC illumination with standard condenser optics 
•    Full compatibility with inverted optical microscopes (e.g. Zeiss Axio Observer, Olympus IX series, Nikon TE, Ti, Ti2, Leica DMI) 
•    Compatible with advanced optical techniques such as TIRF, FRAP, etc. and confocal laser scanning microscopy 
•    Zero crosstalk with fluorescence techniques through infrared laser-based force measurement system (880nm) 
•    Easy and safe operation in liquids 
•    Suitable for use in microscope incubators 
•    Open design for use with Petri dishes (height < 10.5 mm), shallow fluid containers, liquid perfusion, and CO2 enriched gas flow 
•    Available sample size Ø140mm x18mm; unlimited for large samples due to tip-scanning design 
•    Head completely sealed against vapor and liquids 
•    Optical filters for elimination of cross talk with fluorescence illumination 
•    In-situ switch from air to liquid operation 
•    Physical access to cantilever region from all sides (e.g. micro pipettes) 
•    Stand for AFM head included 
•    Includes SP-90-08 JPK Cantilever Holder fixed spring
•    Cantilever holder is easy to clean with detergents, certain solvents and ultrasonic bath 

Light Source
•    980nm light source for better separation from VIS range 
•    Recommended in combination with Super-resolution techniques such as PALM/STORM if optical focus tracking is needed 
•    Laser cleaning filter for shorter wavelength background suppression 
•    Low coherence for suppressing interference 

JPK SPM Controller 
•    Full featured low-noise high-performance digital SPM controller 
•    High speed data capture with maximum data pixel rate up to 800.000 pixels/sec 
•    Modular hybrid analog/digital design with latest FPGA/PPC technology (dual core PowerPC @ 1,4 GHz) overcoming limitations of conventional DSP designs 
•    2 high speed 16bit ADC channels with 60 MHz sample rate 
•    6 18bit ADC channels with 800 kHz sample rate 
•    1 high speed 14bit DAC channel with 120 MHz sample rate 
•    4 20bit DAC channels with 800 kHz sample rate 
•    1 high-speed lock-in amplifier for precise amplitude and phase detection 
•    3 channel low noise capacitive distance sensor interface 
•    Thermal noise cantilever calibration up to 3.75 MHz 
•    Low voltage output for electronics modules and pre-amplifiers with +/-15V and +/-5V 
•    Digital input: 6 channels (Sub-D) Digital output: 10 channels (Sub-D) e.g. for pixel and line clock 
•    Easy Connection of Accessories at the front panel 
•    CE compliant 
•    Connection to control PC by 2 Gigabit LAN 
o    Stand-alone PC configuration:
o    Power supply - 520 Watt NT Modular 
o    Supermicro X11SAE 
o    Intel Core i7-6700 16GB (2x 8GB, DDR4-RAM) 
o    Arctic Cooling Freezer 13 CO 92 mm 
o    HD1: SAMSUNG SSD 800 256GB HD2: SATA-600 WD WDC-                WD40EZRZ-00W, 4TB 
o    HD2: SATA-600 WD WDC-WD40EZRZ-00W, 4TB
o    NVIDIA GP107 GeForce GTX 1050 Ti (4 GB RAM)
o    DVD-RW +/- RW
o    Keyboard and mouse
o    1 x 32” TFT display (or better configuration)
o    Ubuntu OS with pre-configured JPK SPM software (or beter                     configuration) 

Software 
JPK SPM Control Software with workflow-based design
•    Optical Microscopy-inspired, ergonomic, and easy-to-use graphical user     interface 
•    Reliable Linux ® based SPM-software for data-acquisition with scripting     language (Jython) for user developments 
•    Images with arbitrary pixel resolution 
•    Simultaneous acquisition of up to 25 channels 
•    Picture-in-picture display for easy navigation and zooming 
•    ForceWatch™ mode for preventing force drift of the cantilever 
•    Outline™ mode for easy navigation 
•    TipSaver™ and RelativeForce™ mode for force measurements 
•    Online four channel oscilloscopes with FFT functions 
•    Command line interface for low level access 
•    Complete support of external hardware and accessories 
•    Cantilever calibration through thermal noise or Sader method 
•    Automated sample tilt correction with the 3 stepper motors 

JPK Control Software
•    Optical Microscopy inspired, ergonomic and easy-to-use graphical user interface 
•    Java based for use with Linux® or Windows®
•    Designed for bio and soft matter analysis 
•    Icon-based history of processing steps 
•    All major SPM force spectroscopy processing modules 
•    Advanced filtering module 
•    Advanced leveling module, includes histogram fit, and curve fit 
•    Force curve module including batch processing with a variety of fitting routines     such as step fitting, WLC, FJC, JKR, DMT and more 
•    Site license with free upgrades 
•    Easy-to-use Java based graphical user interface 
•    Guided sensor adjustment and force calibration procedure 
•    Flexible configuration of force measurement experiments e.g. simple force-    distance, multi-step movements, holding at pre-defined height/force etc. 
•    Complete control of parameters like contact force, pulling range, contact time,     movement speed etc. 
•    Complete logging of all experimental parameters (position, force, temperature     etc.) 
•    Continuous generation of force distance curves with pre-selected parameters 
•    Cell capture mode for easy cell-sensor attachment 
•    Data export as raw and calibrated data 
•    Macro programming for complex user-defined experiments 

JPK DP Data Processing (DP) Software 
•    Optical Microscopy inspired, ergonomic and easy-to-use graphical user interface 
•    Java based for use with Linux® or Windows®
•    Designed for bio and soft matter imaging and analysis 
•    Icon-based history of processing steps 
•    All major SPM image processing modules 
•    Advanced filtering module 
•    Advanced leveling module, includes histogram fit, and curve fit 
•    Force curve module including batch processing with a variety of fitting routines     such as step fitting, WLC, FJC and more 
•    Batch processing for images with a variety of fitting routines such as JKR, DMT     and more 
•    Cross section and distance measurements 
•    RMS roughness determination 
•    3D rendering module 
•    Site license with free upgrades 

Starter Kits 
JPK NanoWizard® and CellHesion® 200 Starter Kit
• Tweezers and cantilever exchange tool 
• Includes JPK Sample holder for small samples (AC-00-02) 
• Cantilevers:
o    10x Bruker TESP 
o    10x Bruker Peakforce-HIRES-F-A 
o    10x Bruker Peakforce-HIRES-F-B 
o    10x Bruker FESP-V2 
o    10x tipless cantilevers for cell adhesion experiments 

JPK NanoWizard® 4XP Starter Kit
• Tweezers and cantilever exchange tool 
• Includes JPK Sample holder for small samples (AC-00-02) 
•    Cantilevers:
o    10x Bruker TESP-V2
o    10x Bruker Peakforce-HIRES-F-A 
o    10x Bruker Peakforce-HIRES-F-B 
o    10x Bruker FESP-V2 

Software Modules 
JPK DirectOverlay™ 2 Software Module 
•    Improved user-friendly workflow 
•    Automatic calibration of the optical image 
•    Compensation of optical aberration and distortion 
•    Direct read-out of selected cameras or import from other sources 
•    AFM scan selection in the optical background image 
•    Adjustable transparency of the overlaid images 

JPK QI™- Advanced 2 Software Module
•    Second generation QI™ Quantitative Imaging: more reliable and faster imaging 
•    Extends the functions of the QI™ Quantitative Imaging mode 
•    Works across all stiffness ranges including soft and strongly adhesive samples in     liquid 
•    Online calculation of stiffness and adhesion 
•    Full storage of all force curves and channels for post-processing 
•    Simultaneous acquisition of external data e.g. Conductive AFM (with JPK CAFM     module) 

Stages and Accessories 
•    Compatible with inverted microscopes from Zeiss, Nikon, Leica and Olympus. 
•    Sensitive joystick control 
•    Travel range: >20mm x 20 mm 
•    Step size (Resolution): ≤1 μm 
•    Repeatability (unidirectional): ≤2 μm 
•    Maximum velocity: 1mm/s 
•    Compatible with all JPK sample carriers e.g., for glass slides, Petri dishes,     coverslips, metal discs, etc. 
•    Please specify the microscope model when ordering 

Fluid Cells and Temperature Control
•    Insert for Life Science stage 
•    Temperature range: Room temperature up to 60° 
•    Compatible with 35x10mm Petri dishes from WPI and TPP (plastic or plastic with     glass bottom) 
•    Adaptors for other suppliers such as Matek, Willco, IWAKI, Ibidi, and BC upon     request 
•    Ports for perfusion tubes and gas supply (only available for certain types of Petri     dishes) 
•    Silicone anti-evaporation seal 
•    Software control 
•    Temperature stability 0.1 K 
•    Please specify the inverted microscope model when ordering 

Systems and Configurations for all systems 
JPK TopView Optical module to view tip and sample
•    Integrated camera with images captured directly into the AFM software 
•    Can be mounted on the AFM head while the head is mounted on the inverted     fluorescence microscope as well as standalone 
•    Top down view perpendicular to sample plane 
•    Magnification 10x 
•    Up to 5MP, frame rate max 9 FPS 
•    Camera connection type USB 2.0 
•    Please specify the Head (H-XX-XX)

JPK SideView™ cantilever holder - Side View
•    Super cut, fixed spring, length: 15.5 mm 
•    Cantilever holder with precise mounted mirror 
•    Allows both view from below and front of cantilever 
•    Visual observation of tip-sample region e.g. for cell pick-up 
•    Compatible with aqueous solutions and epi-illumination 
•    Available numerical aperture: 0.3
*Objectives with minimum 4mm working distance required (20x recommended). Sideview and Hybrid stage Nikon are compatible. 

Microscopy Kits 
JPK Optical System Data Communication Kit
•    Ubuntu file transfer between JPK SPM and another optical image system for data     transfer for DirectOverlay™ 
•    With hardware (network switch, network cables and TTL-cable with BNC     connection) 

c-mount 1.0x camera adapter

SlimFocus objective lens z-Scanner
•    SlimFocus z tracking with position sensor for microscope objectives 
•    Digital controller 
•    1.5m cable 
•    Objective lens adapter 
•    SlimFocus z tracking software 
•    Range (open loop/closed loop): 180μm/150μm 
•    Resolution (open loop/closed loop): 1.5nm 
•    2 BNC cable 2 m length 

Vibration and Acoustic Isolation 
Benchtop Active Vibration Isolation System 
•    Approved for use with JPK NanoWizard® AFM 
•    Active bandwidth 0.6 Hz – 200 Hz 
•    Isolation: 40 dB above10 Hz 
•    Dimensions: 400 x 500 x 85 mm³ 
•    Weight: 20kg 
•    External power supply

Independently, and not as an agent of the Government, the contractor shall provide equipment and delivery services for Miroshnikova Lab

Specifically, the NIDDK requires completion of the following tasks:

Task Area 1 – Delivery shall be within 3 months from when Purchase Order was sent to the vendor.

Task Area 2 – Shipping will be provided by the vendor to Building 5, Rm 316I, 9000 Rockville Pike, Maryland 20892, which is Miroshnikova’s lab microscopy space. 

Task Area 3 – Installation will be provided by factory-trained service engineers of the manufacturer, no later than 2 weeks after delivery, unless postponed by request of the government.

Task Area 4 – Warranty will be provided by the manufacturer and serviced by their local service engineer(s) will be no less than 1 year from completion of installation, covering all deliverables, labor, labor and travel, minus consumables.

Task Area 5 – Training will be provided within 1 week after installation by applications specialist(s) from the manufacturer..

This Sources Sought is for an organization or institution to provide the NIDDK with JPK NanoWizard® 4 XP Nano Science Atomic Force Microscope (AFM) System.  The purchase of this instrument is necessary to maintain the high quality of our research.  

All qualified small businesses, whether they are small businesses; HUBZone small businesses; service-disabled, veteran owned small businesses; 8(a) small businesses; veteran-owned small businesses; woman-owned small businesses; or small disadvantaged businesses; interested in submitting a corporate capability statement should demonstrate their capability to provide equipment that meets the characteristics above.

SPECIAL INSTRUCTIONS:
This acquisition is being conducted under the authority of FAR Part 13.5 Simplified Acquisition Procedures.

This is a competitive requirement conducted under the authority of FAR 52.211-6, Brand Name or Equal.  This is a requirement for BRUKER NANO, INC. JPK NanoWizard® 4 XP Nano Science Atomic Force Microscope (AFM) System.  

The vendor will be evaluated on their quoted product meeting the specifications under section SALIENT / REQUIRED FEATURES AND SPECIFICATIONS.

If you or your firm/business has an interest and possess the required expertise we invite you to submit a corporate capability statement to assist the Government in determining in accordance with Federal Acquisition Regulation (FAR) 19.502-2(b) whether or not this procurement will be set-aside for any of the programs described above. The associated NAICS code is 334516, Analytical Laboratory Instrument Manufacturing, and the small business size standard is 1,000.  All respondents are requested to identify their firm's size and type of business.

Interested firms responding to this Sources Sought Notice should adhere to the following:
(a) Provide a capability statement demonstrating relevant experience, skills and ability to fulfill the Government's requirements for the above. The capability statement should contain sufficient detail for the Government to make an informed decision regarding your capabilities. The capability statement should not exceed 15 pages using a font size 10 or larger.

(b) Small business concerns that possess the capabilities necessary to undertake the efforts should submit complete documentation of their capabilities to the Contracting Officer. This capability statement should include: 1) the total number of employees, 2) the professional qualifications of scientists, medical experts, and technical personnel as they relate to the requirements, 3) a description of general and specific facilities and equipment available, including computer equipment and software, and 4) any other specific and relevant information that would improve the Government's consideration and evaluation of the information presented.

Further, Past Performance documentation, which should include, but not be limited to, a minimum of two (2) contracts performed for either Government or commercial organizations shall be provided. References shall include for each contract: names, titles, contract number, total price or cost, telephone numbers of government Contracting Officer Representative and Contracting Officers.

(c) All capability statements sent in response to this Small Business Sources Sought notice must be submitted electronically (via email) to the Point of Contact below in MS Word or Adobe Portable Document Format (PDF). The subject line must specify NICHD-21-138. Facsimile responses will not be accepted. Electronically submitted capability statements are due no later than 9:00 AM (Eastern Prevailing Time) seven (7) calendar days (including date of submission to https://beta.sam.gov) after posting of the Small Business Sources Sought Notice.

CAPABILITY STATEMENTS RECEIVED AFTER THIS DATE AND TIME WILL NOT BE CONSIDERED

This notice is for information and planning purposes only and is not to be construed as a commitment by the Government, nor will the Government pay for information solicited.